Figure 2

X-ray beam focused by nanofocusing lenses. (a) shows the illumination function of an X-ray beam which has been obtained by X-ray ptychography prior to a nanofocus diffraction experiment [6]. The image of the illumination function depicts a cross section of the amplitude and phase within the focal plane of the beam and, thus, determines the final spot profile at the sample surface. HA and VA indicate side oscillations due to the lens apertures. (b) is a projection of the intensity distribution of the illumination function to the horizontal axis (dotted line in (a)).