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Table 1 Compositional results (atomic percentages of oxygen (O) and silicon (Si))

From: Morphological, compositional, structural, and optical properties of Si-nc embedded in SiO x films

Temperature (°C)

dss (mm)

Atomic percentage

x = O/Si

  

O

Si

 

1,400

2

30.76

69.22

0.44

1,300

3

61.60

38.38

1.60

1,150

4

56.02

43.96

1.27

1,050

5

64.48

35.50

1.81

900

6

62.49

37.50

1.66

  1. Results of the SiO x films obtained by XEDS.

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