Figure 4From: Effect of periodic number of [Si/Sb80Te20] x multilayer film on its laser-induced crystallization studied by coherent phonon spectroscopyTemperature dependence of sheet resistance of [Si/Sb 80 Te 20 ] x films. (a). The crystallization temperature decreases with the increase of the periodic number. (b) Crystallization temperature as an exponential function of the total thickness of [Si/Sb80Te20] x films.Back to article page