Figure 2From: Fabrication and characterization of La2Zr2O7 films on different buffer architectures for YBa2Cu3O7−δ coated conductors by RF magnetron sputteringTypical XRD patterns of LZO films. (a) ω-scan pattern, (b) φ-scan pattern, and (c) pole figure of LZO films grown on CeO2 buffered NiW tapes with the texture of ∆ ω = 3.4° and ∆ φ = 5.5°.Back to article page