Figure 6From: Fabrication and characterization of La2Zr2O7 films on different buffer architectures for YBa2Cu3O7−δ coated conductors by RF magnetron sputteringEnd-to-end voltage–current characteristics of YBCO-coated conductors. Deposited on the LZO/CeO2, LZO/YSZ/CeO2, and LZO/CeO2/YSZ/CeO2 buffered NiW tapes using the conventional four-probe method tested at 77 K and self field.Back to article page