Figure 5From: Modulation in current density of metal/n-SiC contact by inserting Al2O3 interfacial layerIllustration of the back-to-back diode measurement setup and back-to-back Al/Al 2 O 3 /SiC diode measurements. (a) Illustration of the back-to-back diode measurement setup where only the reverse current is measured. (b) Back-to-back Al/Al2O3/SiC diode measurements demonstrating the effective modulation of current density by the thickness of Al2O3.Back to article page