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Figure 1 | Nanoscale Research Letters

Figure 1

From: Effect of crystal plane orientation on the friction-induced nanofabrication on monocrystalline silicon

Figure 1

Evolution of the scratches on (a) Si(100), (b) Si(110), and (c) Si(111) surfaces. The scratches were produced at a linearly increasing load from 0.3 to 6.0 mN. Each AFM image (2 × 2 μm2) was taken from the appointed segment of the same scratch on silicon with a given crystal plane. The arrows on the cross-sectional profiles indicate the appearance of the groove.

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