Figure 7
From: Maskless and low-destructive nanofabrication on quartz by friction-induced selective etching
XTEM observation of quartz samples produced by a nanoscratch tester. TEM images of (a) low-destructive scanned area and (b) groove before KOH etching. TEM images of (c) low-destructive scanned area and (d) groove after KOH etching. The centre of each scanned area was marked with a white arrow. The inset pictures are the AFM images of the low-destructive scanned area and groove, respectively.