Figure 1From: Influence of embedding Cu nano-particles into a Cu/SiO2/Pt structure on its resistive switchingCu concentrations within SiO 2 layer along different paths. (a) HRTEM cross-sectional image of a Cu/Cu-NP embedded SiO2/Pt sample. (b) Energy-dispersive X-ray spectroscopy (EDX) result along line A-B. (c) Energy-dispersive X-ray spectroscopy (EDX) result along line C-D.Back to article page