Figure 1
From: Low-frequency flicker noise in a MSM device made with single Si nanowire (diameter ≈ 50 nm)
Schematic diagram, MSM structure and SEM image. (a) Schematic diagram of a single Si NW with e-beam-deposited Pt contact electrodes. (b) A representative MSM structure of the NW device, consisting of two Schottky diodes connected back to back with a series resistance RNW. (c) SEM image of the single Si NW device with four electrical leads, and the inset shows a HRTEM image of the wire itself.