Figure 6From: Absolute flatness measurements of silicon mirrors by a three-intersection method by near-infrared interferometryTest configurations in absolute flatness measurements by the three-intersection method. For (a) rotation axis on diagonal, (b) another diagonal, (c) line at y = 10.0 mm, and (d) lines at x = -10.0, -5.0, 0.0, 5.0, and 10.0 mm.Back to article page