Figure 3From: Highly organised and dense vertical silicon nanowire arrays grown in porous alumina template on <100> silicon wafersEnergy dispersive X-ray (EDX) analysis of Si NW. (a) SEM image of the cross section, (b) aluminium cartography, (c) oxygen cartography, (d) silicon cartography, (e) gold cartography and (f) profile counts of oxygen, aluminium and silicon, along the arrow of (a). The EDX analyses were conducted at 5-kV high voltage and for a 7-mm WD.Back to article page