Figure 5
From: Displacing, squeezing, and time evolution of quantum states for nanoelectronic circuits

Fluctuations. This inset shows fluctuations (dashed line) and (thick solid line) (a), and (dashed line) and (thick solid line) (b), and uncertainty product (dashed line) and (thick solid line) (c) as a function of t where n1=n2=0, , R0 = R1 = R2 = 0.1, L0 = L1 = L2 = 1, C1 = 1, and C2 = 1.2. The values of squeezing parameters for the DSN are r1 = 0.1, r2 = 0.3, ϕ1 = 1.2, and ϕ2 = 0.6.