Figure 1From: Free-field characterization via directional transmission through a nanoapertureThe system concept. The concept of the nanoslit-based probe for characterization of subwavelength-structured free fields. The inset shows the design parameters of the device: the aperture width w, the screen thickness h, and the thickness h t of a thin TiO2 layer as well as the period d, groove depth h m , and trench width f of the corrugations.Back to article page