Figure 10From: Free-field characterization via directional transmission through a nanoapertureImages of the structure. Scanning electron microscope (SEM) and atomic force microscope (AFM) images of the structure. (a) SEM image of the Al glue interface, (b) SEM image of the entrance surface showing the slit, and (c) AFM image of the top surface, where the color bar indicates depth scale from -10 nm (black) to 10 nm (white).Back to article page