Figure 4From: Fabrication, characterization and simulation of Ω-gate twin poly-Si FinFET nonvolatile memoryEndurance and retention characteristics. (a) Endurance characteristics of the twin poly-Si TFT EEPROM by FN and BBHE. (b) Retention characteristics of the twin poly-Si TFT EEPROM at 85°C by FN and BBHE.Back to article page