Figure 4From: Ion beam-generated surface ripples: new insight in the underlying mechanismX-TEM images of 50 keV Ar+-irradiated set A samples. At the fluences of (a) 5 × 1016, (b) 7 × 1017, (c) 9 × 1017 ions per square centimeter, and set B samples (d) 5 × 1016 (for normal incidence) and (e) 7 × 1017 ions per square centimeter. SAED pattern for the amorphized and bulk crystalline regimes is in (f).Back to article page