Figure 2From: Energy transfer from luminescent centers to Er3+ in erbium-doped silicon-rich oxide filmsDecay curve of PL peaked at 2.2 eV and HRTEM image for the SROEr film. Decay curve of the PL signal recorded at 2.2 eV for the SROEr film annealed at 1,150°C for 30 min (denoted by empty circles). The experiment data is fitted by stretched exponential function (denoted by solid line). The inset shows the HRTEM image of the SROEr film annealed at 1,150°C for 30 min.Back to article page