Figure 5
From: In situ growth of well-dispersed CdS nanocrystals in semiconducting polymers
X-ray scattering measurements (WAXS) of CdS/MEH-PPV nanocomposites. Obtained at 185°C for samples with precursor/polymer weight/weight ratio of 1:4 (curve B) and 4:1 (curve C). For reference and comparison, the WAXS pattern of pristine MEH-PPV is also shown (curve A). The diffraction peaks labelled as ‘P’ and asterisk ‘*’are due to the crystalline nanodomains of the conjugated polymer.