Figure 1From: Correlation between matrix structural order and compressive stress exerted on silicon nanocrystals embedded in silicon-rich silicon oxideRaman spectra measured for samples deposited with r H equal to 10%, 30%, and 50%. To compare, a reference spectrum of bulk Si is also shown. The spectra have been upshifted for clarity reasons. The inset shows fit of the phonon confinement model to the spectrum measured for rH = 50% sample.Back to article page