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Table 1 The optical band gap ( E _g ) and Urbach energy ( E _U ) determined for the investigated samples

From: Correlation between matrix structural order and compressive stress exerted on silicon nanocrystals embedded in silicon-rich silicon oxide

r_H(%)	E_g(eV) (m= 1/2)	E_u(meV)
10	3.75	73
30	3.97	75
50	4.22	90

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