Figure 3From: Focused ion beam processing to fabricate ohmic contact electrodes on a bismuth nanowire for Hall measurementsMicrographs of electrodes fabricated on a 521-nm-diameter bismuth nanowire. (a) Optical micrograph of the sample processed by FIB, (b) SEM micrograph of the electrical connections to the bismuth nanowire, and (c) magnified SEM micrograph of the FIB processed area.Back to article page