Different types of imaging showing different characteristics of formed WS
nanosheets and FFT analysis. (a) TEM image of the WS2 nanosheets. (b, d) High-resolution TEM images for the selected regions are shown. (c) Two-dimensional FFT analysis for the WS2 nanosheets. (e) Tapping-mode AFM image of the WS2 nanosheets and (g) the corresponding thickness distribution. (f) High-resolution TEM image of the curled edge for the nanosheets.