Figure 2
From: Charge transport mechanisms and memory effects in amorphous TaN x thin films
Surface morphology of TaN x with AFM imaging. (a) AFM mapping of the TaN x film on Au substrate reveals smooth round-shaped nanoislands. (b) The corresponding histogram shows that the average roughness is 48 nm. (c) AFM mapping of the TaN x film on Si substrate reveals grainy nanoislands with high roughness consisting of smaller nanoparticles. (d) The distribution of the film’s roughness is shown with average of 248 nm.