Figure 2From: Improvement of optical transmittance and electrical properties for the Si quantum dot-embedded ZnO thin filmCrystalline properties of ZnO matrix. (a) XRD patterns fine-scanned from 30° to 40° of the Si QD-embedded ZnO thin films under different Tann. (b) Full XRD pattern of the Si QD-embedded ZnO thin film annealed at 700°C. The inset shows the curve fitting result for the main diffraction signal.Back to article page