Figure 2From: Fabrication of graphene films with high transparent conducting characteristicsAFM image, section analysis profile, and 3D surface morphology of the deposited graphene film. (a) An AFM image of the graphene film deposited on quartz for 3 min. (b) The section analysis profile of the red line in (a). The yellow horizontal line shows the position of measuring the film thickness. (c) 3D surface morphology of the graphene film.Back to article page