Figure 10From: The surface condition effect of Cu2O flower/grass-like nanoarchitectures grown on Cu foil and Cu filmAFM topography image, surface ditch height, and residual stress. (a) AFM three-dimensional topography image of the unpolished Cu foil specimen. (b) Surface ditch height and residual stress of unpolished Cu foil, polished Cu foil, and Cu film specimens.Back to article page