Figure 1From: Characterization of single 1.8-nm Au nanoparticle attachments on AFM tips for single sub-4-nm object pickupSchematic diagram depicting the procedures used to attach a single Au-NP to the AFM probe tip. (a) An image is taken to find the position of each Au-NP. (b) The AFM tip is moved above the selected Au-NP. (c) The probe is moved toward the Au-NP and the waveform generator applies a pulse of voltage to the AFM probe. (d) The Au-NP is evaporated and redeposited on the AFM tip. (e) The probe is withdrawn. (f) An image is taken again to verify the absence of the Au-NP. The figures are not drawn to scale.Back to article page