Figure 2From: Comparison of resistive switching characteristics using copper and aluminum electrodes on GeOx/W cross-point memoriesTEM images of the cross-point memories using Cu electrode. (a) TEM image of a Cu/GeO x /W cross-point memory. HRTEM image with scale bars of (b) 0.2 μm and (c) 5 nm. Films deposited layer by layer are clearly observed by HRTEM imaging.Back to article page