Figure 2From: On the origin of emission and thermal quenching of SRSO:Er3+ films grown by ECR-PECVDTime-resolved PL spectra. SRSO:Er3+ samples obtained at 266-nm excitation for (a, b, c) 37% and (d, e, f) 39% of Si. Δt, integrating time; Δt, delay time.Back to article page