Figure 3From: On the origin of emission and thermal quenching of SRSO:Er3+ films grown by ECR-PECVDTime evolution of the 1,535-nm band. (a) PL decay obtained for samples with 37 and 39 at.% of Si at 266 and (b) 488 nm. (c) MEM distribution of emission decay at 266-nm excitation for 37 and 39 at.% of Si and (d) MEM distribution of emission decay at 488-nm excitation for 37 and 39 at.% of Si.Back to article page