Figure 3
X-ray diffraction scans and Bi SIMS profiles. (004) X-ray diffraction ω/2θ transverse scans (a) and Bi SIMS profiles for the differently annealed samples (b).
Figure 3 | Nanoscale Research Letters
X-ray diffraction scans and Bi SIMS profiles. (004) X-ray diffraction ω/2θ transverse scans (a) and Bi SIMS profiles for the differently annealed samples (b).