RETRACTED ARTICLE: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface

Prakash, Amit; Maikap, Siddheswar; Chiu, Hsien-Chin; Tien, Ta-Chang; Lai, Chao-Sung

doi:10.1186/1556-276X-9-152

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RETRACTED ARTICLE: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaO_x interface

Last updated: Fri, 19 Apr 2024 5:10:05 UTC

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This article is in the 1^st percentile (ranked 185,365^th) of the 209,418 tracked articles of a similar age in all journals and the 1^st percentile (ranked 9^th) of the 17 tracked articles of a similar age in Discover Nano.

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