Figure 7From: Fabrication of nanochannels with ladder nanostructure at the bottom using AFM nanoscratching methodSchematic of material removal mechanisms by an AFM tip. ( a ) The SEM image of the diamond AFM tip. ( b ) The front view of the nanochannel fabrication process. The A-A cross-section indicated in FigureĀ 7( b ) with the displacement of the tip relative to the sample during one scanning process in the ( c ) positive and ( d ) negative direction of x axis.Back to article page