Figure 5
SEM images and XRD spectra in experiment C. (a) SEM images of BiNPs deposited on ITO glass substrates at 160 °C (Bi-301). (b) SEM images of BiNPs deposited on ITO glass substrates at 200°C (Bi-302). (c) XRD spectra of the BiNPs prepared on c-plane sapphire at 200°C and 0.12 W/cm2 for 60 s (Bi-304). (d) A closer look from 2θ = 24° to 2θ = 30°, in which Bi(003) and Bi2O3 diffraction peaks can be identified.