Figure 11From: Resistive switching behavior in Lu2O3 thin film for advanced flexible memory applicationsDistributions of voltages for cycle-to-cycle and device-to-device measurements. Weibull distribution of set/reset voltages for (a) C2C and (b) D2D measurements. HRS and LRS distributions of the device for (c) C2C and (d) D2D measurements.Back to article page