Figure 1

Typical TEM results. Results of (a) a TF nanowire whose preferred growth direction is perpendicular to (001) planar defects and (b) an AF nanowire whose preferred growth direction is parallel to (001) planar defects. Results of a nanowire whose planar defects are (c) invisible along the [110] zone axis, but (d) clearly revealed after titling to the [010] zone axis. Results of (e) a nanowire whose planar defects (f) are invisible after a full range of tilting examination. The same nanowire (g) was picked up and repositioned by a micromanipulator. Planar defects (h) are now clearly shown.