Figure 6From: Observation of ‘hidden’ planar defects in boron carbide nanowires and identification of their orientationsExperimental validation of the three simulated AF cases. TEM results of a nanowire whose planar defects are invisible from both (a) [001] and (b) 10 1 ¯ zone axes. The analyzed diffraction patterns agree with the simulated ‘AF case 1’ and ‘AF case 2’, indicating that the nanowire is an AF one. (c) After the reposition-reexamination process, planar defects are revealed and the nanowire is confirmed to have axial faults. TEM results of another nanowire (d, e), which confirm the correctness of ‘AF case 3’.Back to article page