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Figure 6 | Nanoscale Research Letters

Figure 6

From: Observation of ‘hidden’ planar defects in boron carbide nanowires and identification of their orientations

Figure 6

Experimental validation of the three simulated AF cases. TEM results of a nanowire whose planar defects are invisible from both (a) [001] and (b) 10 1 ¯ zone axes. The analyzed diffraction patterns agree with the simulated ‘AF case 1’ and ‘AF case 2’, indicating that the nanowire is an AF one. (c) After the reposition-reexamination process, planar defects are revealed and the nanowire is confirmed to have axial faults. TEM results of another nanowire (d, e), which confirm the correctness of ‘AF case 3’.

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