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Table 1 Simulated results for determination of fault orientation within a nanowire whose TEM results are from the off-zone directions

From: Observation of ‘hidden’ planar defects in boron carbide nanowires and identification of their orientations

Case no.

Zone axis

Alignment of the projected preferred growth direction in the diffraction pattern

TF case 1

[001]

Through 1 ¯ 1 ¯ 0 and 110 spots

TF case 2

10 1 ¯

Through 1 ¯ 0 1 ¯ and 101 spots

01 1 ¯

Through 0 1 ¯ 1 ¯ and 011 spots

AF case 1

[001]

Perpendicular to the tie line between 0 1 ¯ 0 and 010 spots

AF case 2

10 1 ¯

Perpendicular to the tie line between 010 and 0 1 ¯ 0 spots

AF case 3

01 1 ¯

Perpendicular to the tie line between 011 and 0 1 ¯ 1 ¯ spots

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