Table 1 Simulated results for determination of fault orientation within a nanowire whose TEM results are from the off-zone directions
Case no. | Zone axis | Alignment of the projected preferred growth direction in the diffraction pattern |
---|---|---|
TF case 1 | [001] | Through and 110 spots |
TF case 2 |
| Through and 101 spots |
| Through and 011 spots | |
AF case 1 | [001] | Perpendicular to the tie line between and 010 spots |
AF case 2 |
| Perpendicular to the tie line between 010 and spots |
AF case 3 |
| Perpendicular to the tie line between 011 and spots |