Skip to main content
Account
Figure 10 | Nanoscale Research Letters

Figure 10

From: A comparative study of two different approaches for the incorporation of silver nanoparticles into layer-by-layer films

Figure 10

Cross-sectional TEM micrographs of the upper part of the thin film and AFM phase images. (a, b) Cross-sectional TEM micrograph of the upper part of the thin film and AFM surface phase image for the ISS process. (c, d) Cross-sectional TEM micrograph of the upper part of the thin film and AFM surface phase image for the LbL-E deposition technique.

Back to article page

Navigation