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Erratum to: Growth and crystallographic feature-dependent characterization of spinel zinc ferrite thin films by RF sputtering

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The original article was published in Nanoscale Research Letters 2013 8:537

Correction

Figure 4g in the original version of this article [1] was misused in the typesetting process. The figure 4g is the same as figure 4a. The corrected image for figure 4g is shown here (Figure 1).

Figure 1
figure1

Low-magnification TEM image of the ZFO film on the Si.

References

  1. 1.

    Liang YC, Hsia HY: Growth and crystallographic feature-dependent characterization of spinel zinc ferrite thin films by RF sputtering. Nanoscale Res Lett 2013, 8: 537. 10.1186/1556-276X-8-537

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Correspondence to Yuan-Chang Liang.

Additional information

The online version of the original article can be found at 10.1186/1556-276X-8-537

Authors’ original submitted files for images

Below are the links to the authors’ original submitted files for images.

Authors’ original file for figure 1

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