Figure 3From: Characterization of photovoltaics with In2S3 nanoflakes/p-Si heterojunctionSEM images of the p-Si substrate and an EDX analysis of the In 2 S 3 film. (a) Side-view and (b) top-view SEM images of the textured p-Si substrate, and (c) 50-nm, (d) 100-nm, and (e) 300-nm thick In2S3 films onto the textured p-Si. (f) EDX analysis of the In2S3 film, and the inset is a high-magnitude SEM image.Back to article page