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Figure 1 | Nanoscale Research Letters

Figure 1

From: The role of Si interstitials in the migration and growth of Ge nanocrystallites under thermal annealing in an oxidizing ambient

Figure 1

Formation of Ge nanocrystallite clusters by thermally oxidizing poly-Si 0.85 Ge 0.15 pillars grown over buffer oxide. (a) Schematic diagram of the initially as-formed poly-SiGe pillars, (b) cross-sectional transmission electron microscopy (CTEM) micrograph of a self-assembled cluster of Ge nanocrystallites in the core of the oxidized pillars following 900°C 20 min oxidation in an H2O ambient, and (c) enlarged CTEM micrograph of the Ge nanocrystallites.

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