Figure 5
From: Size evolution of ion beam synthesized Pb nanoparticles in Al
XRD θ -2 θ scans (a) and (b) for the samples with different implantation fluences. The implantation current density is 2.0 μAcm-2. The arrows in (a) show the positions of Si(111), Pb(111), and Al(111) diffractions, respectively. The dashed line in (b)indicates the peak position of bulk Pb(111) diffractions. The diffraction profiles are shifted vertically for clarity.