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Table 2 Optical spectra of a substrate TiO 2 /Ag/SiO 2 /air structure simulated using the Macleod software

From: Conductive and transparent multilayer films for low-temperature TiO2/Ag/SiO2 electrodes by E-beam evaporation with IAD

Value of yE (Tio2/Ag/SiO2) Re (admittance) Im (admittance)
20:10:20 nm 0.87 −1.42
40:10:40 nm 0.78 −0.98
60:10:60 nm 0.66 −0.78
20:10:40 nm 0.6 −0.95
25:10:70 nm 0.7 −0.40