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Table 2 Optical spectra of a substrate TiO 2 /Ag/SiO 2 /air structure simulated using the Macleod software

From: Conductive and transparent multilayer films for low-temperature TiO2/Ag/SiO2 electrodes by E-beam evaporation with IAD

Value of yE (Tio2/Ag/SiO2)

Re (admittance)

Im (admittance)

20:10:20 nm

0.87

−1.42

40:10:40 nm

0.78

−0.98

60:10:60 nm

0.66

−0.78

20:10:40 nm

0.6

−0.95

25:10:70 nm

0.7

−0.40

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