Figure 2From: Scandium effect on the luminescence of Er-Sc silicates prepared from multi-nanolayer filmsCross-sectional TEM images, EDS concentration profiles, and AFM images. (a, c) Cross-sectional TEM images before and after annealing at 1,250°C with SAED images in the insets. (b, d) EDS concentration profiles of Er, Sc, O, and Si for the corresponding inset TEM images (a) and (c), respectively. (e, f) AFM images of the sample after deposition and annealing at 1,250°C.Back to article page