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Figure 5 | Nanoscale Research Letters

Figure 5

From: Ripple coarsening on ion beam-eroded surfaces

Figure 5

Calculated PSD of images of Xe + ion beam-eroded Si surfaces for fluences. Fluences are from Φ = 1.12 × 1017 cm-2 up to Φ = 1.35 × 1019 cm-2, Eion= 1,200 eV, jion= 300 μ A/cm2, ion incidence angle of α = 75°. The dotted vertical lines mark the shortest and longest ripple wavelength, respectively. The arrows highlight the wavelength at the corresponding fluence.

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