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Figure 6 | Nanoscale Research Letters

Figure 6

From: Ripple coarsening on ion beam-eroded surfaces

Figure 6

Structure wavelength and RMS roughness as a function of fluence for Xe + irradiated samples for fluences. Fluences are from Φ = 1.12 × 1017 cm-2 up to Φ = 1.35 × 1019 cm-2. Eion = 600 eV, ion incidence angle of α = 65° (a, b) and α = 75° (c, d).

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