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Figure 3 | Nanoscale Research Letters

Figure 3

From: Controlled morphology and optical properties of n-type porous silicon: effect of magnetic field and electrode-assisted LEF

Figure 3

Top and cross-sectional micrographs of nPS samples fabricated using e-LEF setup. Effect of LEF at locations close to the anode and cathode: (a-b) 30 V for 10 min and (c-d) 50 V for 3 min. (e) Top image close to the anodic region of the sample etched at 50 V during 5 min and (f) cross-sectional view of the n++ sample etched applying a lateral current of 25 mA for 5 min.

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