Figure 1From: Cross-sectional analysis of W-cored Ni nanoparticle via focused ion beam milling with impregnationPlan-view morphology of the W-Ni bimetallic nanoparticle by way of conventional sample preparation method. (a) TEM image of W-Ni bimetallic nanoparticles. (b) STEM photograph and the chemical composition were measured by point quantification. (c) Core/shell structured nanoparticle. (d) High-resolution TEM image of (c).Back to article page